针尖增强拉曼光谱法测量4H-SiC(000-1)碳面上外延石墨烯局部区域的应力变化

Tip-enhanced Raman spectroscopic measurement of stress change in the local domain of epitaxial graphene on the carbon face of 4H-SiC(000-1).

作者信息

Suzuki Toshiaki, Itoh Tamitake, Vantasin Sanpon, Minami Satoshi, Kutsuma Yasunori, Ashida Koji, Kaneko Tada-aki, Morisawa Yusuke, Miura Takeshi, Ozaki Yukihiro

机构信息

Department of Chemistry, School of Science and Technology, Kwansei Gakuin University, Gakuen 2-1, Sanda, Hyogo 669-1337, Japan.

出版信息

Phys Chem Chem Phys. 2014 Oct 7;16(37):20236-40. doi: 10.1039/c4cp02078b.

DOI:10.1039/c4cp02078b

PMID:25140359

Abstract

We develop a bulk silver tip for tip-enhanced Raman scattering (TERS) and obtain TERS spectra of epitaxial graphene on the carbon face of 4H-SiC(000-1) with a high signal-to-noise ratio. Thanks to the high quality of TERS spectra we firstly find that the G band in the TERS spectra exhibits position-by-position variations in both lower wavenumber shifts and spectral broadening. The analysis of the variations reveals that the shifts and broadenings have a linear correlation between each other, indicating that the variations are induced by the position dependent local stress on graphene based on a uniaxial strain model.

摘要

我们研制了一种用于针尖增强拉曼散射（TERS）的块状银针尖，并获得了4H-SiC(000-1)碳面上外延石墨烯的高信噪比TERS光谱。由于TERS光谱的高质量，我们首次发现TERS光谱中的G带在较低波数位移和光谱展宽方面都呈现出逐点变化。对这些变化的分析表明，位移和展宽之间存在线性相关性，这表明基于单轴应变模型，这些变化是由石墨烯上与位置相关的局部应力引起的。