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硫化镉量子点中表面陷阱态的起源:尺寸依赖光致发光与硫空位陷阱态之间的关系。

Origin of surface trap states in CdS quantum dots: relationship between size dependent photoluminescence and sulfur vacancy trap states.

作者信息

Veamatahau Aisea, Jiang Bo, Seifert Tom, Makuta Satoshi, Latham Kay, Kanehara Masayuki, Teranishi Toshiharu, Tachibana Yasuhiro

机构信息

School of Aerospace, Mechanical and Manufacturing Engineering, RMIT University, Bundoora, VIC 3083, Australia.

出版信息

Phys Chem Chem Phys. 2015 Jan 28;17(4):2850-8. doi: 10.1039/c4cp04761c. Epub 2014 Dec 15.

Abstract

Monodisperse cadmium sulphide (CdS) quantum dots (QDs) with a tunable size from 1.4 to 4.3 nm were synthesized by a non-injection method, and their surface states were characterized by photoluminescence spectroscopy and X-ray Photoelectron Spectroscopy (XPS). The steady state photoluminescence study identified that the proportion of the trap state emission increased with the QD size decrease, while from the photoluminescence decay study, it appeared that the trap state emission results from the emission via a surface deep trap state. The XPS measurements revealed the existence of surface Cd with sulfur vacancy sites which act as electron trap sites, and the population of these sites increases with the QD size decrease. These results are consistent to conclude that the trap state emission mainly originates from the surface deep trapped electrons at the surface Cd with sulfur vacancy sites.

摘要

采用非注入法合成了尺寸在1.4至4.3 nm之间可调的单分散硫化镉(CdS)量子点(QDs),并通过光致发光光谱和X射线光电子能谱(XPS)对其表面态进行了表征。稳态光致发光研究表明,陷阱态发射的比例随量子点尺寸的减小而增加,而从光致发光衰减研究来看,陷阱态发射似乎是通过表面深陷阱态的发射产生的。XPS测量揭示了存在带有硫空位的表面Cd,这些硫空位充当电子陷阱位点,并且这些位点的数量随量子点尺寸的减小而增加。这些结果一致表明,陷阱态发射主要源于表面带有硫空位的Cd处的表面深捕获电子。

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