Department of Chemical Engineering, Massachusetts Institute of Technology , Cambridge, Massachusetts 02139, United States.
ACS Nano. 2015 Jan 27;9(1):512-20. doi: 10.1021/nn505744r. Epub 2014 Dec 23.
X-ray photoelectron spectroscopy (XPS) depth profiling with C60(+) sputtering was used to resolve the lithium-ion distribution in the nanometer-scale domain structures of block polymer electrolyte thin films. The electrolytes of interest are mixtures of lithium trifluoromethanesulfonate and lamellar-forming polystyrene-poly(oligo(oxyethylene)methacrylate) (PS-POEM) copolymer. XPS depth profiling results showed that the lithium-ion concentration was directly correlated with the POEM concentration. Furthermore, chemical state and atomic composition of the film were analyzed through the deconvolution of the C1s signal, indicating that the lithium ions appear to be uniformly distributed in the POEM domains. Overall, the unique capabilities of C60(+) depth profiling XPS provide a powerful tool for the analysis of nanostructured polymer thin films in applications ranging from energy storage and generation to surface coatings and nanoscale templates.
采用 C60(+)溅射的 X 射线光电子能谱（XPS）深度剖析技术，解决了嵌段聚合物电解质薄膜纳米级畴结构中锂离子分布的问题。所研究的电解质是三氟甲烷磺酸锂和层状形成的聚苯乙烯-聚（聚氧乙烯甲基丙烯酸酯）（PS-POEM）共聚物的混合物。XPS 深度剖析结果表明，锂离子浓度与 POEM 浓度直接相关。此外，通过 C1s 信号的解卷积分析了薄膜的化学状态和原子组成，表明锂离子似乎均匀分布在 POEM 畴中。总的来说，C60(+)深度剖析 XPS 的独特功能为从储能和发电到表面涂层和纳米级模板等应用领域的纳米结构聚合物薄膜分析提供了强大的工具。
