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砷化镓/砷化铝镓核壳纳米线中耦合载流子输运的亚表面成像。

Subsurface imaging of coupled carrier transport in GaAs/AlGaAs core-shell nanowires.

机构信息

Department of Materials Science and Engineering and ∥Department of Physics, Drexel University , 3141 Chestnut Street, Philadelphia, Pennsylvania 19104, United States.

出版信息

Nano Lett. 2015 Jan 14;15(1):75-9. doi: 10.1021/nl502995q. Epub 2014 Dec 29.

Abstract

We demonstrate spatial probing of carrier transport within GaAs/AlGaAs core-shell nanowires with nanometer lateral resolution and subsurface sensitivity by energy-variable electron beam induced current imaging. Carrier drift that evolves with applied electric field is distinguished from a coupled drift-diffusion length. Along with simulation of injected electron trajectories, combining beam energy tuning with precise positioning for selective probing of core and shell reveals axial position- and bias-dependent differences in carrier type and transport along parallel conduction channels. These results indicate how analysis of transport within heterostructured nanomaterials is no longer limited to nonlocal or surface measurements.

摘要

我们通过能量可变电子束诱导电流成像,展示了 GaAs/AlGaAs 核壳纳米线中载流子输运的空间探测,具有纳米级的横向分辨率和亚表面灵敏度。通过应用电场演变的载流子漂移与耦合的漂移扩散长度区分开来。通过模拟注入电子的轨迹,结合束能调谐和精确定位,选择性地探测核壳,揭示了沿平行传导通道的载流子类型和输运在轴向位置和偏压依赖性方面的差异。这些结果表明,异质结构纳米材料内部传输的分析不再局限于非局部或表面测量。

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