Lifton Joseph J, Malcolm Andrew A, McBride John W
Electro-Mechanical Engineering Group, The University of Southampton, Southampton, UK.
Singapore Institute of Manufacturing Technology, Precision Measurements Group, Singapore.
J Xray Sci Technol. 2015;23(1):65-82. doi: 10.3233/XST-140471.
X-ray computed tomography (CT) is a radiographic scanning technique for visualising cross-sectional images of an object non-destructively. From these cross-sectional images it is possible to evaluate internal dimensional features of a workpiece which may otherwise be inaccessible to tactile and optical instruments. Beam hardening is a physical process that degrades the quality of CT images and has previously been suggested to influence dimensional measurements. Using a validated simulation tool, the influence of spectrum pre-filtration and beam hardening correction are evaluated for internal and external dimensional measurements. Beam hardening is shown to influence internal and external dimensions in opposition, and to have a greater influence on outer dimensions compared to inner dimensions. The results suggest the combination of spectrum pre-filtration and a local gradient-based surface determination method are able to greatly reduce the influence of beam hardening in X-ray CT for dimensional metrology.
X射线计算机断层扫描(CT)是一种射线照相扫描技术,用于无损可视化物体的横截面图像。从这些横截面图像中,可以评估工件的内部尺寸特征,而触觉和光学仪器可能无法获取这些特征。束硬化是一种会降低CT图像质量的物理过程,此前有人认为它会影响尺寸测量。使用经过验证的模拟工具,评估了光谱预过滤和束硬化校正对内部和外部尺寸测量的影响。结果表明,束硬化对内部和外部尺寸的影响相反,并且与内部尺寸相比,对外部尺寸的影响更大。结果表明,光谱预过滤和基于局部梯度的表面确定方法相结合,能够大大减少束硬化在X射线CT尺寸计量中的影响。