Ji Sanghoon, Cho Gu Young, Yu Wonjong, Su Pei-Chen, Lee Min Hwan, Cha Suk Won
Graduate School of Convergence Science and Technology, Seoul National University , Iui-dong, Yeongtong-gu, Suwon 443-270, South Korea.
ACS Appl Mater Interfaces. 2015 Feb 11;7(5):2998-3002. doi: 10.1021/am508710s. Epub 2015 Feb 2.
Nanoscale yttria-stabilized zirconia (YSZ) electrolyte film was deposited by plasma-enhanced atomic layer deposition (PEALD) on a porous anodic aluminum oxide supporting substrate for solid oxide fuel cells. The minimum thickness of PEALD-YSZ electrolyte required for a consistently high open circuit voltage of 1.17 V at 500 °C is 70 nm, which is much thinner than the reported thickness of 180 nm using nonplasmatic ALD and is also the thinnest attainable value reported in the literatures on a porous supporting substrate. By further reducing the electrolyte thickness, the grain size reduction resulted in high surface grain boundary density at the cathode/electrolyte interface.
通过等离子体增强原子层沉积(PEALD)在用于固体氧化物燃料电池的多孔阳极氧化铝支撑基板上沉积了纳米级氧化钇稳定氧化锆(YSZ)电解质薄膜。在500℃下持续保持1.17V的高开路电压所需的PEALD-YSZ电解质的最小厚度为70nm,这比使用非等离子体ALD报道的180nm厚度要薄得多,也是在多孔支撑基板的文献中报道的可达到的最薄值。通过进一步减小电解质厚度,晶粒尺寸减小导致阴极/电解质界面处的表面晶界密度升高。