Department of Surface and Plasma Science, Faculty of Mathematics and Physics, Charles University in Prague, V Holešovičkách 2, 180 00 Prague 8, Czech Republic.
Nanoscale. 2015 Mar 7;7(9):4038-47. doi: 10.1039/c4nr06550f.
The morphology and composition of CeOx films prepared by r.f. magnetron sputtering on a graphite foil have been investigated mainly by using microscopy methods. This study presents the formation of nanocrystalline layers with porous structure due to the modification of a carbon support and the formation of cerium carbide crystallites as a result of the deposition process. Chemical analyses of the layers with different thicknesses performed by energy dispersive X-ray spectroscopy, electron energy loss spectroscopy and X-ray photoelectron spectroscopy have pointed to the reduction of the cerium oxide layers. In the deposited layers, cerium was present in mixed Ce(3+) and Ce(4+) valence. Ce(3+) species were located mainly at the graphite foil-CeOx interface and the chemical state of cerium was gradually changing to Ce(4+) going to the layer surface. It became more stoichiometric in the case of thicker layers except for the surface region, where the presence of Ce(3+) was associated with oxygen vacancies on the surface of cerium oxide grains. The degree of cerium oxide reduction is discussed in the context of particle size.
采用显微镜方法主要研究了射频磁控溅射在石墨箔上制备的 CeOx 薄膜的形貌和组成。本研究由于碳载体的改性以及由于沉积过程形成碳化铈晶而形成了具有多孔结构的纳米晶层。通过能量色散 X 射线光谱、电子能量损失光谱和 X 射线光电子能谱对不同厚度的层进行的化学分析表明,CeOx 层被还原。在沉积层中,铈以混合的 Ce(3+)和 Ce(4+)价态存在。Ce(3+)物种主要位于石墨箔-CeOx 界面处,铈的化学状态逐渐从 Ce(3+)向 Ce(4+)变化,向层表面变化。在较厚的层中,其化学计量比变得更加准确,而在表面区域,Ce(3+)的存在与 CeOx 颗粒表面的氧空位有关。在粒径的背景下讨论了 CeOx 还原的程度。