Wang Hu, Qi Hongji, Wang Bin, Cui Yanyan, Guo Meng, Zhao Jiaoling, Jin Yunxia, Shao Jianda
Opt Express. 2015 Feb 23;23(4):5213-20. doi: 10.1364/OE.23.005213.
By considering the rapid change of standing-wave electric-field and assuming the interface defect distribution, an improved model is developed to analyze the defect density distribution and assess the damage performance of high-reflective coatings. Two kinds of high-reflective coatings deposited by e-beam evaporation (EBE) and ion beam sputtering (IBS) techniques are analyzed with this method. The lower overall damage threshold is the major feature for the coatings deposited by IBS method according to the defect parameters extracted from the model. Typical damage morphologies of coatings are also measured and analyzed. The assumption of interface defects is supported by the damage behavior. The damage mechanisms of two high-reflective coatings are attributed to the formation of molten pool and mechanical ejection. The influence of the incident angle on the damage probability is also considered and numerically calculated. The defect analysis model improved here is suitable for high-reflective coatings.
通过考虑驻波电场的快速变化并假设界面缺陷分布,开发了一种改进模型来分析缺陷密度分布并评估高反射涂层的损伤性能。用该方法分析了通过电子束蒸发(EBE)和离子束溅射(IBS)技术沉积的两种高反射涂层。根据从模型中提取的缺陷参数,IBS方法沉积的涂层的主要特征是总体损伤阈值较低。还测量并分析了涂层的典型损伤形态。损伤行为支持了界面缺陷的假设。两种高反射涂层的损伤机制归因于熔池的形成和机械喷射。还考虑并数值计算了入射角对损伤概率的影响。这里改进的缺陷分析模型适用于高反射涂层。