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退火对用于紫外线应用的HfO/SiO光学涂层的性能和表现的影响。

Effect of annealing on properties and performance of HfO/SiO optical coatings for UV-applications.

作者信息

Falmbigl Matthias, Godin Kyle, George Jason, Mühlig Christian, Rubin Binyamin

出版信息

Opt Express. 2022 Apr 11;30(8):12326-12336. doi: 10.1364/OE.453345.

Abstract

The field of ultraviolet (UV)-laser applications is currently experiencing rapid growth in the semiconductor processing, laser micromachining and biomedical markets. Key enablers for these technologies are optical coatings used to manipulate and guide laser beams in a targeted manner. As laser power, laser fluence and pulse frequencies increase, the demands on the physical properties of the coating materials become more stringent. Ion beam sputtering is a technique that allows producing optical coatings with the low losses required in these applications. In this study, we investigate the influence of ion beam sputtering (IBS) parameters on the optical properties of HfO and SiO single layers as well as the impact of annealing duration at 475 °C for anti-reflective (AR) and highly reflective (HR) optical coatings at 355 nm. For HfO sputtered from a metal target the O flow during the coating process is a key parameter to reduce absorption. SiO single layers exhibit improved transmission in the UV-range as the ion beam energy for the sputtering process is reduced. Furthermore, a complex behavior for film stress, absorption, surface roughness and coating structure was unraveled as a function of annealing duration for AR- and HR-coatings at 355 nm. The reflectance of the HR-mirror after optimized annealing exceeded 99.94% at 355 nm and a high laser induced damage threshold (LIDT) of 6.9 J/cm was measured after 2 hours of annealing. For the AR-coating a LIDT-value of 15.7 J/cm was observed after 12 hours of annealing.

摘要

紫外(UV)激光应用领域目前在半导体加工、激光微加工和生物医学市场正经历快速增长。这些技术的关键推动因素是用于以有针对性的方式操纵和引导激光束的光学涂层。随着激光功率、激光能量密度和脉冲频率的增加,对涂层材料物理性能的要求变得更加严格。离子束溅射是一种能够生产出这些应用所需低损耗光学涂层的技术。在本研究中,我们研究了离子束溅射(IBS)参数对HfO和SiO单层光学性能的影响,以及在475°C下退火持续时间对355nm抗反射(AR)和高反射(HR)光学涂层的影响。对于从金属靶溅射的HfO,镀膜过程中的氧流量是降低吸收的关键参数。随着溅射过程中离子束能量的降低,SiO单层在紫外波段的透过率有所提高。此外,还揭示了355nm AR和HR涂层的薄膜应力、吸收、表面粗糙度和涂层结构随退火持续时间的复杂变化情况。优化退火后的HR镜在355nm处的反射率超过99.94%,退火2小时后测得的激光诱导损伤阈值(LIDT)高达6.9J/cm²。对于AR涂层,退火12小时后观察到的LIDT值为15.7J/cm²。

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