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通过原子力显微镜和多重分形分析对铜镍纳米颗粒@非晶碳氢化薄膜进行形貌表征

Topographic Characterization of Cu-Ni NPs @ a-C:H Films by AFM and Multifractal Analysis.

作者信息

Ţălu Ştefan, Stach Sebastian, Ghodselahi Tayebeh, Ghaderi Atefeh, Solaymani Shahram, Boochani Arash, Garczyk Żaneta

机构信息

†Technical University of Cluj-Napoca, Faculty of Mechanical Engineering, Department of AET, Discipline of Descriptive Geometry and Engineering Graphics, 103-105 B-dul Muncii St., Cluj-Napoca 400641, Cluj, Romania.

‡University of Silesia, Faculty of Computer Science and Materials Science, Institute of Informatics, Department of Biomedical Computer Systems, Będzińska 39, 41-205 Sosnowiec, Poland.

出版信息

J Phys Chem B. 2015 Apr 30;119(17):5662-70. doi: 10.1021/acs.jpcb.5b00042. Epub 2015 Apr 17.

DOI:10.1021/acs.jpcb.5b00042
PMID:25839675
Abstract

In the present work three-dimensional (3-D) surface topography of Cu-Ni nanoparticles in hydrogenated amorphous carbon (Cu-Ni NPs @ a-C:H) with constant thickness of Cu and three thicknesses of Ni prepared by RF-Plasma Enhanced Chemical Vapor Deposition (RF-PECVD) system were investigated. The thin films of Cu-Ni NPs @ a-C:H with constant thickness of Cu and three thicknesses of Ni deposited by radio frequency (RF)-sputtering and RF-PECVD systems, were characterized. To determine the mass thickness and atomic structure of the films, the Rutherford backscattering spectroscopy (RBS) spectra was applied. The absorption spectra were applied to study localized surface plasmon resonance (LSPR) peaks of Cu-Ni NPs (observed around 608 nm in visible spectra), which is widened and shifted to lower wavelengths as the thickness of Ni over layer increases, and their changes are also evaluated by the 3-D surface topography. These nanostructures were investigated over square areas of 1 μm × 1 μm using atomic force microscopy (AFM) and multifractal analysis. Topographic characterization of surface samples (in amplitude, spatial distribution, and pattern of surface characteristics) highlighted 3-D surfaces with multifractal features which can be quantitatively estimated by the multifractal measures. The 3-D surface topography Cu-Ni NPs @ a-C:H with constant thickness of Cu and three thicknesses of Ni prepared by RF-PECVD system can be characterized using the multifractal geometry in correlation with the surface statistical parameters.

摘要

在本工作中,研究了通过射频等离子体增强化学气相沉积(RF-PECVD)系统制备的、具有恒定铜厚度和三种镍厚度的氢化非晶碳中的铜镍纳米颗粒(Cu-Ni NPs @ a-C:H)的三维(3-D)表面形貌。对通过射频(RF)溅射和RF-PECVD系统沉积的、具有恒定铜厚度和三种镍厚度的Cu-Ni NPs @ a-C:H薄膜进行了表征。为了确定薄膜的质量厚度和原子结构,应用了卢瑟福背散射光谱(RBS)谱。应用吸收光谱来研究Cu-Ni NPs的局域表面等离子体共振(LSPR)峰(在可见光谱中约608 nm处观察到),随着镍覆盖层厚度的增加,该峰变宽并向较低波长移动,并且还通过三维表面形貌对其变化进行了评估。使用原子力显微镜(AFM)和多重分形分析在1μm×1μm的方形区域上对这些纳米结构进行了研究。表面样品的形貌表征(在幅度、空间分布和表面特征模式方面)突出了具有多重分形特征的三维表面,这些特征可以通过多重分形测量进行定量估计。通过RF-PECVD系统制备的、具有恒定铜厚度和三种镍厚度的Cu-Ni NPs @ a-C:H的三维表面形貌可以使用与表面统计参数相关的多重分形几何来表征。

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