Sulania Indra, Agarwal Dinesh, Husain Mushahid, Avasthi Devesh Kumar
Inter University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi, 110067 India ; Jamia Millia Islamia, Jamia Nagar, New Delhi, 110025 India.
Inter University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi, 110067 India.
Nanoscale Res Lett. 2015 Feb 28;10:88. doi: 10.1186/s11671-015-0751-4. eCollection 2015.
We have investigated the formation of nanoripples on the surface of germanium, Ge(100), due to the effect of 100-keV Ar (+) ion irradiation. The irradiation was carried out at different incidence angles from 0° to 75° in steps of 15° with respect to the surface normal with a fixed ion fluence of approximately 3 × 10(17) ions/cm(2). Atomic force micrographs show an increase in surface roughness from 0.5 to 4.3 nm for the pristine sample and the sample irradiated at 60° incidence angle due to cos(-1)(θ) dependence on sputtering yield. With increase in angle of incidence, there is transition observed from nanodots to aligned nanodots perpendicular to the direction of the beam. There is an increase in size of the nanostructures observed from 44 to 103 nm with angle of incidence. The formation of nanoripples initiates at an angle of θ ~ 45°. Ripple pattern formation has taken place on the Ge surface in the energy regime of 100 keV as compared to the other reports which had been carried out using very low energy ions. Raman spectra reveal that the near surface of crystalline Ge samples becomes amorphous due to interaction of Ar(+) ions due to creation of defects through collision cascades.
我们研究了100 keV Ar(+)离子辐照对锗(Ge(100))表面纳米波纹形成的影响。辐照在相对于表面法线从0°到75°的不同入射角下进行,步长为15°,固定离子注量约为3×10(17)离子/cm(2)。原子力显微镜照片显示,由于溅射产率对cos(-1)(θ)的依赖性,原始样品和以60°入射角辐照的样品的表面粗糙度从0.5增加到4.3 nm。随着入射角的增加,观察到从纳米点到垂直于光束方向排列的纳米点的转变。随着入射角的增加,观察到纳米结构的尺寸从44 nm增加到103 nm。纳米波纹的形成始于θ ~ 45°的角度。与其他使用非常低能量离子进行的报告相比,在100 keV的能量范围内,Ge表面已经形成了波纹图案。拉曼光谱表明,由于Ar(+)离子的相互作用,通过碰撞级联产生缺陷,晶体Ge样品的近表面变成了非晶态。