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聚偏二氟乙烯α和γ晶体在纳米层状薄膜中的取向

Orientation of PVDF α and γ crystals in nanolayered films.

作者信息

Jurczuk Kinga, Galeski Andrzej, Mackey Matthew, Hiltner Anne, Baer Eric

机构信息

Department of Polymer Physics, Centre of Molecular and Macromolecular Studies, Polish Academy of Sciences, Sienkiewicza 112, 90-363 Lodz, Poland.

Center for Layered Polymeric Systems, Department of Macromolecular Science and Engineering, Case Western Reserve University, Cleveland, OH 44106-7202 USA.

出版信息

Colloid Polym Sci. 2015;293(4):1289-1297. doi: 10.1007/s00396-015-3542-7. Epub 2015 Feb 28.

DOI:10.1007/s00396-015-3542-7
PMID:25859068
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC4379396/
Abstract

Wide-angle X-ray scattering in conjunction with pole figure technique was used to study the texture of poly(vinylidene fluoride) (PVDF) α and γ phase crystals in nanolayered polysulfone/poly(vinylidene fluoride) films (PSF/PVDF) produced by layer-multiplying coextrusion. In all as-extruded PSF/PVDF films, the PVDF nanolayers crystallized into the α phase crystals. A large fraction of those crystals was oriented with macromolecular chains perpendicular to the PSF/PVDF interface as evidenced from the (021) pole figures. Further refinement of the texture occurs during isothermal recrystallization at 170 °C in conjunction with transformation of α to γ crystals. The γ crystals orientation was probed with the (004) pole figures showing the -axis of PVDF γ crystals perpendicular to the PSF/PVDF interface. The thinner the PVDF layers the stronger the orientation of γ crystals. It was proven that the X-ray reflections from the (021) planes of α crystals and from the (004) planes of γ crystals are not overlapped with other reflections and can be effectively used for the texture determination of PVDF nanolayers in multilayered PSF/PVDF films.

摘要

广角X射线散射结合极图技术被用于研究通过层倍增共挤出制备的纳米层状聚砜/聚偏氟乙烯(PSF/PVDF)薄膜中聚偏氟乙烯(PVDF)α相和γ相晶体的织构。在所有挤出态的PSF/PVDF薄膜中,PVDF纳米层结晶为α相晶体。如(021)极图所示,这些晶体中的很大一部分以垂直于PSF/PVDF界面的大分子链取向。在170°C等温重结晶过程中,伴随着α相向γ相晶体的转变,织构进一步细化。用(004)极图探测γ晶体取向,结果表明PVDFγ晶体的c轴垂直于PSF/PVDF界面。PVDF层越薄,γ晶体的取向越强。已证明α晶体(021)面和γ晶体(004)面的X射线反射不与其他反射重叠,可有效用于多层PSF/PVDF薄膜中PVDF纳米层的织构测定。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d4f7/4379396/30cd6a756862/396_2015_3542_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d4f7/4379396/2a5fca67adcc/396_2015_3542_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d4f7/4379396/bdd76b7efe93/396_2015_3542_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d4f7/4379396/e04aa4270243/396_2015_3542_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d4f7/4379396/30cd6a756862/396_2015_3542_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d4f7/4379396/2a5fca67adcc/396_2015_3542_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d4f7/4379396/bdd76b7efe93/396_2015_3542_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d4f7/4379396/e04aa4270243/396_2015_3542_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d4f7/4379396/30cd6a756862/396_2015_3542_Fig4_HTML.jpg

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