Takemura Yasutaka, Lee Du-Yeong, Lee Seung-Eun, Chae Kyo-Suk, Shim Tae-Hun, Lian Guoda, Kim Moon, Park Jea-Gun
MRAM Center, Department of Electronics, Hanyang University, Seoul, 133-791, Korea. Epitaxial Engineering Department, SUMCO CORPORATION, 1007-62 Izumisawa, Chitose-shi, Hokkaido 066-0051, Japan.
Nanotechnology. 2015 May 15;26(19):195702. doi: 10.1088/0957-4484/26/19/195702. Epub 2015 Apr 21.
The TMR ratio of Co2Fe6B2/MgO-based p-MTJ spin valves stacked with a [Co/Pd]n-SyAF layer decreased rapidly when the ex situ magnetic annealing temperature (Tex) was increased from 275 to 325 °C, and this decrease was associated with degradation of the Co2Fe6B2 pinned layer rather than the Co2Fe6B2 free layer. At a Tex above 325 °C the amorphous Co2Fe6B2 pinned layer was transformed into a face-centered-cubic (fcc) crystalline layer textured from [Co/Pd]n-SyAF, abruptly reducing the Δ1 coherence tunneling of perpendicular-spin-torque electrons between the (100) MgO tunneling barrier and the fcc Co2Fe6B2 pinned layer.
当非原位磁退火温度(Tex)从275℃升高到325℃时,与[Co/Pd]n-SyAF层堆叠的基于Co2Fe6B2/MgO的p-MTJ自旋阀的TMR比率迅速下降,并且这种下降与Co2Fe6B2钉扎层的退化有关,而不是与Co2Fe6B2自由层有关。在Tex高于325℃时,非晶Co2Fe6B2钉扎层转变为从[Co/Pd]n-SyAF织构化的面心立方(fcc)晶体层,突然降低了(100)MgO隧道势垒与fcc Co2Fe6B2钉扎层之间垂直自旋扭矩电子的Δ1相干隧穿。