Marty-Dessus D, Ziani A C, Petre A, Berquez L
Université de Toulouse, UPS, LAPLACE, 118 route de Narbonne, F-31062 Toulouse, France.
Université de Pau et des Pays de l'Adour, SIAME, IPRA, 2 avenue du Président Pierre Angot, F-64053 Pau, France.
Rev Sci Instrum. 2015 Apr;86(4):043905. doi: 10.1063/1.4919008.
A new technique for the determination of space charge profiles in insulating polymers is proposed. Based on the evolution of an existing thermal wave technique called Focused Laser Intensity Modulation Method ((F)LIMM), it allows non-contact measurements on thin films exhibiting an internal charge to be studied. An electrostatic model taking into account the new sample-cell geometry proposed was first developed. It has been shown, in particular, that it was theoretically possible to calculate the internal charge from experimental measurements while allowing an evaluation of the air layer appearing between the sample and the electrode when non-contact measurements are performed. These predictions were confirmed by an experimental implementation for two thin polymer samples (25 μm-polyvinylidenefluoride and 50 μm-polytetrafluoroethylene (PTFE)) used as tests. In these cases, minimum air-layer thickness was determined with an accuracy of 3% and 20%, respectively, depending on the signal-to-noise ratio during the experimental procedure. In order to illustrate the reachable possibilities of this technique, 2D and 3D cartographies of a negative space charge implanted by electron beam within the PTFE test sample were depicted: like in conventional (F)LIMM, a multidimensional representation of a selectively implanted charge remains possible at a few microns depth, but using a non-contacting way of measurement.
本文提出了一种测定绝缘聚合物中空间电荷分布的新技术。该技术基于一种现有的热波技术——聚焦激光强度调制法((F)LIMM)的改进,可对存在内部电荷的薄膜进行非接触式测量。首先建立了一个考虑新提出的样品 - 电池几何结构的静电模型。特别指出,从理论上讲,通过实验测量计算内部电荷是可行的,同时在进行非接触测量时,可以评估样品与电极之间出现的空气层。通过对两个用作测试的聚合物薄膜样品(25μm聚偏二氟乙烯和50μm聚四氟乙烯(PTFE))的实验验证了这些预测。在这些情况下,根据实验过程中的信噪比,分别以3%和20%的精度确定了最小空气层厚度。为了说明该技术的可行性,描绘了PTFE测试样品中通过电子束注入的负空间电荷的二维和三维分布图:与传统的(F)LIMM一样,在几微米深度处仍可以通过非接触测量方式对选择性注入电荷进行多维表示。