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利用表面反射率图像来测量各种光纤的折射率分布。

Exploiting the image of the surface reflectivity to measure refractive index profiling for various optical fibers.

作者信息

Weng Chun-Jen, Hsu Ken-Yuh, Chen Yung-Fu

出版信息

Opt Express. 2015 May 4;23(9):11755-62. doi: 10.1364/OE.23.011755.

DOI:10.1364/OE.23.011755
PMID:25969266
Abstract

A direct image method of surface reflectivities on a cleaved fiber end with a filtered halogen lamp and a TE-cooled CCD with high dynamic range is proposed to measure the multi-wavelength refractive index profiling (RIP). A polished black glass is used to be a reference standard for measuring the absolute reflectivity of the fiber end. With the developed calibration procedures, both the spatially dependent sensitivity and spectral responsivity of the CCD pixels can be eliminated to achieve the high spatial accuracy. Tested fiber is connected with a fiber terminator to prevent errors from the backside return light. With the present method, the RIP can be precisely measured for not only multi-mode fibers but also single-mode fibers.

摘要

提出了一种利用滤波卤素灯和具有高动态范围的TE制冷电荷耦合器件(CCD)测量劈裂光纤端面表面反射率的直接成像方法,用于测量多波长折射率分布(RIP)。使用抛光的黑色玻璃作为测量光纤端面绝对反射率的参考标准。通过开发的校准程序,可以消除CCD像素的空间相关灵敏度和光谱响应,以实现高空间精度。测试光纤与光纤终端器相连,以防止背面返回光产生误差。利用本方法,不仅可以精确测量多模光纤的RIP,也可以精确测量单模光纤的RIP。

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