Zhou Liang, Zhang Tian-Yi, Liu Zhong-Chuan, Liu Peng, Dong Yu-Hui
Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences, 19B Yuquan Road, Shijingshan District, Beijing, People's Republic of China.
Acta Crystallogr A Found Adv. 2014 Jul;70(Pt 4):364-72. doi: 10.1107/S2053273314007049. Epub 2014 Jun 13.
With the development of X-ray free-electron lasers (XFELs), it is possible to determine the three-dimensional structures of noncrystalline objects with coherent X-ray diffraction imaging. In this diffract-and-destroy mode, many snapshot diffraction patterns are obtained from the identical objects which are presented one by one in random orientations to the XFEL beam. Determination of the orientation of an individual object is essential for reconstruction of a three-dimensional structure. Here a new method, called the multiple-common-lines method, has been proposed to determine the orientations of high- and low-signal snapshot diffraction patterns. The mean errors of recovered orientations (α, β, γ) of high- and low-signal patterns are about 0.14, 0.06, 0.12 and 0.77, 0.31, 0.60°, respectively; both sets of errors can meet the requirements of the reconstruction of a three-dimensional structure.
随着X射线自由电子激光（XFEL）的发展，利用相干X射线衍射成像来确定非晶态物体的三维结构成为可能。在这种衍射并破坏模式下，从相同的物体获得许多快照衍射图案，这些物体以随机取向逐个呈现给XFEL光束。确定单个物体的取向对于三维结构的重建至关重要。在此，提出了一种称为多重共线法的新方法来确定高信号和低信号快照衍射图案的取向。高信号和低信号图案恢复取向（α、β、γ）的平均误差分别约为0.14°、0.06°、0.12°和0.77°、0.31°、0.60°；这两组误差均能满足三维结构重建的要求。
