通过原子力显微镜对表面反应进行表征。
Characterization of a surface reaction by means of atomic force microscopy.
机构信息
†Institute of Experimental and Applied Physics, University of Regensburg, 93053 Regensburg, Germany.
‡Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany.
出版信息
J Am Chem Soc. 2015 Jun 17;137(23):7424-8. doi: 10.1021/jacs.5b03114. Epub 2015 Jun 3.
We study a thermally activated on-surface planarization reaction by a detailed analysis of the reactant and reaction products from atomically resolved atomic force microscopy (AFM) images and spectroscopy. The three-dimensional (3D) structure of the reactant, a helical diphenanthrene derivative, requires going beyond constant-height imaging. The characterization in three dimensions is enabled by acquisition and analysis of the AFM signal in a 3D data set. This way, the structure and geometry of nonplanar molecules as well as their reaction products on terraces and at step edges can be determined.
我们通过原子分辨原子力显微镜（AFM）图像和光谱对反应物和反应产物进行详细分析，研究了一种热激活的表面平坦化反应。反应物——一种螺旋二菲衍生物——的三维（3D）结构需要超越恒高成像。通过获取和分析 3D 数据集的 AFM 信号，可以实现三维表征。这样，就可以确定非平面分子的结构和几何形状，以及它们在平台和台阶边缘的反应产物。
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