Advanced atomic force microscopy techniques III.
作者信息
Glatzel Thilo, Schimmel Thomas
机构信息
Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland.
Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), 76021 Karlsruhe, Germany.
出版信息
Beilstein J Nanotechnol. 2016 Jul 21;7:1052-4. doi: 10.3762/bjnano.7.98. eCollection 2016.
Abstract
摘要
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