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Cr 掺杂 Bi2Se3 拓扑绝缘体的原子级磁学性质。

Atomic-Scale Magnetism of Cr-Doped Bi2Se3 Thin Film Topological Insulators.

机构信息

York-Nanjing Joint Center (YNJC) for Spintronics and Nanoengineering, School of Electronics Science and Engineering, Nanjing University , Nanjing 210093, China.

Spintronics and Nanodevice Laboratory, Department of Electronics, University of York , York YO10 5DD, United Kingdom.

出版信息

ACS Nano. 2015 Oct 27;9(10):10237-43. doi: 10.1021/acsnano.5b03980. Epub 2015 Sep 10.

Abstract

Magnetic doping is the most common method for breaking time-reversal-symmetry surface states of topological insulators (TIs) to realize novel physical phenomena and to create beneficial technological applications. Here we present a study of the magnetic coupling of a prototype magnetic TI, that is, Cr-doped Bi2Se3, in its ultrathin limit which is expected to give rise to quantum anomalous Hall (QAH) effect. The high quality Bi2-xCrxSe3 epitaxial thin film was prepared using molecular beam epitaxy (MBE), characterized with scanning transimission electron microscopy (STEM), electrical magnetotransport, and X-ray magnetic circularly dichroism (XMCD) techniques, and the results were simulated using density functional theory (DFT) with spin-orbit coupling (SOC). We observed a sizable spin moment mspin = (2.05 ± 0.20) μB/Cr and a small and negative orbital moment morb = (-0.05 ± 0.02) μB/Cr of the Bi1.94Cr0.06Se3 thin film at 2.5 K. A remarkable fraction of the (CrBi-CrI)(3+) antiferromagnetic dimer in the Bi2-xCrxSe3 for 0.02 < x < 0.40 was obtained using first-principles simulations, which was neglected in previous studies. The spontaneous coexistence of ferro- and antiferromagnetic Cr defects in Bi2-xCrxSe3 explains our experimental observations and those based on conventional magnetometry which universally report magnetic moments significantly lower than 3 μB/Cr predicted by Hund's rule.

摘要

磁性掺杂是打破拓扑绝缘体(TI)时间反演对称表面态以实现新物理现象和创造有益技术应用的最常见方法。在这里,我们研究了原型磁性 TI,即 Cr 掺杂的 Bi2Se3 的磁性耦合,预计在其超薄极限下会产生量子反常霍尔(QAH)效应。使用分子束外延(MBE)制备了高质量的 Bi2-xCrxSe3 外延薄膜,并用扫描透射电子显微镜(STEM)、电磁输运和 X 射线圆二色性(XMCD)技术进行了表征,并使用具有自旋轨道耦合(SOC)的密度泛函理论(DFT)进行了模拟。我们在 2.5 K 下观察到 Bi1.94Cr0.06Se3 薄膜的可观自旋矩 mspin = (2.05 ± 0.20) μB/Cr 和小而负的轨道矩 morb = (-0.05 ± 0.02) μB/Cr。通过第一性原理模拟获得了 Bi2-xCrxSe3 中(CrBi-CrI)(3+)反铁磁二聚体的显著分数,对于 0.02 < x < 0.40,这在以前的研究中被忽略了。Bi2-xCrxSe3 中铁磁和反铁磁 Cr 缺陷的自发共存解释了我们的实验观察结果和基于常规磁强计的结果,这些结果普遍报告的磁矩明显低于 Hund 规则预测的 3 μB/Cr。

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