Physics and Chemistry of Nanostructures, Ghent University , Krijgslaan 281-S3, 9000 Ghent, Belgium.
Nano Lett. 2015 Nov 11;15(11):7481-7. doi: 10.1021/acs.nanolett.5b03068. Epub 2015 Oct 20.
Using an optimized lift-off process we develop a technique for both nanoscale and single-dot patterning of colloidal quantum dot films, demonstrating feature sizes down to ~30 nm for uniform films and a yield of 40% for single-dot positioning, which is in good agreement with a newly developed theoretical model. While first of all presenting a unique tool for studying physics of single quantum dots, the process also provides a pathway toward practical quantum dot-based optoelectronic devices.
我们采用了一种经过优化的lift-off 工艺,开发出了一种用于胶体量子点薄膜的纳米级和单颗粒图案化技术,证明了均匀薄膜的特征尺寸可低至约 30nm,并且单颗粒定位的产率可达 40%,这与新开发的理论模型非常吻合。该工艺首先为研究单个量子点的物理特性提供了一种独特的工具,同时也为基于量子点的实用光电设备开辟了道路。