Perumal Veeradasan, Hashim Uda, Gopinath Subash C B, Haarindraprasad R, Liu Wei-Wen, Poopalan P, Balakrishnan S R, Thivina V, Ruslinda A R
Biomedical Nano Diagnostics Research Group, Institute of Nano Electronic Engineering (INEE), Universiti Malaysia Perlis (UniMAP), Kangar, Perlis, Malaysia.
School of Microelectronic Engineering, University Malaysia Perlis (UniMAP), Kuala Perlis, Perlis, Malaysia.
PLoS One. 2015 Dec 22;10(12):e0144964. doi: 10.1371/journal.pone.0144964. eCollection 2015.
The creation of an appropriate thin film is important for the development of novel sensing surfaces, which will ultimately enhance the properties and output of high-performance sensors. In this study, we have fabricated and characterized zinc oxide (ZnO) thin films on silicon substrates, which were hybridized with gold nanoparticles (AuNPs) to obtain ZnO-Aux (x = 10, 20, 30, 40 and 50 nm) hybrid structures with different thicknesses. Nanoscale imaging by field emission scanning electron microscopy revealed increasing film uniformity and coverage with the Au deposition thickness. Transmission electron microscopy analysis indicated that the AuNPs exhibit an increasing average diameter (5-10 nm). The face center cubic Au were found to co-exist with wurtzite ZnO nanostructure. Atomic force microscopy observations revealed that as the Au content increased, the overall crystallite size increased, which was supported by X-ray diffraction measurements. The structural characterizations indicated that the Au on the ZnO crystal lattice exists without any impurities in a preferred orientation (002). When the ZnO thickness increased from 10 to 40 nm, transmittance and an optical bandgap value decreased. Interestingly, with 50 nm thickness, the band gap value was increased, which might be due to the Burstein-Moss effect. Photoluminescence studies revealed that the overall structural defect (green emission) improved significantly as the Au deposition increased. The impedance measurements shows a decreasing value of impedance arc with increasing Au thicknesses (0 to 40 nm). In contrast, the 50 nm AuNP impedance arc shows an increased value compared to lower sputtering thicknesses, which indicated the presence of larger sized AuNPs that form a continuous film, and its ohmic characteristics changed to rectifying characteristics. This improved hybrid thin film (ZnO/Au) is suitable for a wide range of sensing applications.
制备合适的薄膜对于新型传感表面的开发至关重要,这最终将提升高性能传感器的性能和输出。在本研究中,我们在硅衬底上制备并表征了氧化锌(ZnO)薄膜,该薄膜与金纳米颗粒(AuNPs)杂交以获得具有不同厚度的ZnO-Aux(x = 10、20、30、40和50 nm)混合结构。场发射扫描电子显微镜的纳米级成像显示,随着金沉积厚度的增加,薄膜的均匀性和覆盖率提高。透射电子显微镜分析表明,AuNPs的平均直径增大(5-10 nm)。发现面心立方Au与纤锌矿ZnO纳米结构共存。原子力显微镜观察表明,随着Au含量的增加,整体微晶尺寸增大,X射线衍射测量结果支持了这一点。结构表征表明,ZnO晶格上的Au以优选取向(002)存在且无任何杂质。当ZnO厚度从10 nm增加到40 nm时,透射率和光学带隙值降低。有趣的是,当厚度为50 nm时,带隙值增加,这可能是由于Burstein-Moss效应。光致发光研究表明,随着金沉积量的增加,整体结构缺陷(绿色发射)显著改善。阻抗测量显示,随着Au厚度增加(0至40 nm),阻抗弧值减小。相比之下,50 nm AuNP阻抗弧与较低溅射厚度相比显示出增大的值,这表明存在形成连续膜的较大尺寸AuNPs,并且其欧姆特性转变为整流特性。这种改进的混合薄膜(ZnO/Au)适用于广泛的传感应用。