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分子结的介观电化学

The Mesoscopic Electrochemistry of Molecular Junctions.

作者信息

Bueno Paulo R, Benites Tiago A, Davis Jason J

机构信息

Institute of Chemistry, Physical Chemistry Department, Univ. Estadual Paulista (São Paulo State University, UNESP), Nanobionics group, CP 355, 14800-900, Araraquara, São Paulo, Brazil.

Department of Chemistry, University of Oxford, South Parks Road, Oxford OX1 3QZ, UK.

出版信息

Sci Rep. 2016 Jan 13;6:18400. doi: 10.1038/srep18400.

Abstract

Within the context of an electron dynamic (time-dependent) perspective and a voltage driving force acting to redistribute electrons between metallic and addressable molecular states, we define here the associated electron admittance and conductance. We specifically present a mesoscopic approach to resolving the electron transfer rate associated with the electrochemistry of a redox active film tethered to metallic leads and immersed in electrolyte. The methodology is centred on aligning the lifetime of the process of electron exchange with associated resistance and capacitance quantities. Notably, however, these are no longer those empirically known as charge transfer resistance and pseudo-capacitance, but are those derived instead from a consideration of the quantum states contained in molecular films and their accessibility through a scattering region existing between them and the metallic probe. The averaged lifetime (τr) associated with the redox site occupancy is specifically dependent on scattering associated with the quantum channels linking them to the underlying metallic continuum and associated with both a quantum resistance (Rq) and an electrochemical (redox) capacitance (Cr). These are related to electron transfer rate through k = 1/τr = (RqCr)(-1). The proposed mesoscopic approach is consistent with Marcus's (electron transfer rate) theory and experimental measurements obtained by capacitance spectroscopy.

摘要

在电子动力学(与时间相关)的视角以及作用于在金属态和可寻址分子态之间重新分配电子的电压驱动力的背景下,我们在此定义相关的电子导纳和电导。我们特别提出一种介观方法来解析与附着于金属引线并浸入电解质中的氧化还原活性膜的电化学相关的电子转移速率。该方法的核心是使电子交换过程的寿命与相关的电阻和电容量相匹配。然而,值得注意的是,这些不再是经验上所知的电荷转移电阻和伪电容,而是相反地从对分子膜中包含的量子态及其通过它们与金属探针之间存在的散射区域的可及性的考虑中得出的量。与氧化还原位点占据相关的平均寿命(τr)具体取决于与将它们连接到下层金属连续体的量子通道相关的散射,并且与量子电阻(Rq)和电化学(氧化还原)电容(Cr)都相关。这些通过k = 1/τr = (RqCr)(-1)与电子转移速率相关。所提出的介观方法与马库斯(电子转移速率)理论以及通过电容光谱法获得的实验测量结果一致。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8067/4725828/1621b1026db9/srep18400-f1.jpg

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