De Caro Liberato, Altamura Davide, Arciniegas Milena, Siliqi Dritan, Kim Mee R, Sibillano Teresa, Manna Liberato, Giannini Cinzia
Istituto di Cristallografia, Consiglio Nazionale delle Ricerche, via Amendola 122/O, 70126 Bari, Italy.
Istituto Italiano di Tecnologia (IIT), via Morego 30, IT-16163 Genova, Italy.
Sci Rep. 2016 Jan 18;6:19397. doi: 10.1038/srep19397.
Research on composite materials is facing, among others, the challenging task of incorporating nanocrystals, and their superstructures, in polymer matrices. Electron microscopy can typically image nanometre-scale structures embedded in thin polymer films, but not in films that are micron size thick. Here, X-ray Ptychography was used to visualize, with a resolution of a few tens of nanometers, how CdSe/CdS octapod-shaped nanocrystals self-assemble in polystyrene films of 24 ± 4 μm, providing a unique means for non-destructive investigation of nanoparticles distribution and organization in thick polymer films.
复合材料研究面临着诸多挑战,其中一项具有挑战性的任务是将纳米晶体及其超结构融入聚合物基体中。电子显微镜通常能够对嵌入聚合物薄膜中的纳米级结构成像,但对于微米级厚度的薄膜则无法成像。在此,利用X射线叠层成像技术以几十纳米的分辨率可视化了CdSe/CdS八足形纳米晶体如何在厚度为24±4μm的聚苯乙烯薄膜中自组装,为无损研究厚聚合物薄膜中纳米颗粒的分布和组织提供了一种独特的方法。