Grieve J A, Chandrasekara R, Tang Z, Cheng C, Ling A
Opt Express. 2016 Feb 22;24(4):3592-600. doi: 10.1364/OE.24.003592.
In this paper we present a general method for estimating rates of accidental coincidence between a pair of single photon detectors operated within their saturation regimes. By folding the effects of recovery time of both detectors and the detection circuit into an "effective duty cycle" we are able to accomodate complex recovery behaviour at high event rates. As an example, we provide a detailed high-level model for the behaviour of passively quenched avalanche photodiodes, and demonstrate effective background subtraction at rates commonly associated with detector saturation. We show that by post-processing using the updated model, we observe an improvement in polarization correlation visibility from 88.7% to 96.9% in our experimental dataset. This technique will be useful in improving the signal-to-noise ratio in applications which depend on coincidence measurements, especially in situations where rapid changes in flux may cause detector saturation.
在本文中，我们提出了一种通用方法，用于估计在饱和状态下工作的一对单光子探测器之间的偶然符合率。通过将两个探测器和检测电路的恢复时间效应纳入“有效占空比”，我们能够适应高事件率下的复杂恢复行为。作为一个例子，我们提供了一个关于被动淬灭雪崩光电二极管行为的详细高级模型，并展示了在通常与探测器饱和相关的速率下有效的背景扣除。我们表明，通过使用更新后的模型进行后处理，在我们的实验数据集中，我们观察到偏振相关可见度从88.7%提高到了96.9%。该技术将有助于提高依赖符合测量的应用中的信噪比，特别是在通量快速变化可能导致探测器饱和的情况下。
