RIKEN SPring-8 Center , 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan.
Paul Scherrer Institut , CH-5232 Villigen, Switzerland.
Struct Dyn. 2016 Jan 29;3(3):034301. doi: 10.1063/1.4939655. eCollection 2016 May.
We report a method for achieving advanced photon diagnostics of x-ray free-electron lasers (XFELs) under a quasi-noninvasive condition by using a beam-splitting scheme. Here, we used a transmission grating to generate multiple branches of x-ray beams. One of the two primary diffracted branches (+1st-order) is utilized for spectral measurement in a dispersive scheme, while the other (-1st-order) is dedicated for arrival timing diagnostics between the XFEL and the optical laser pulses. The transmitted x-ray beam (0th-order) is guided to an experimental station. To confirm the validity of this timing-monitoring scheme, we measured the correlation between the arrival timings of the -1st and 0th branches. The observed error was as small as 7.0 fs in root-mean-square. Our result showed the applicability of the beam branching scheme to advanced photon diagnostics, which will further enhance experimental capabilities of XFEL.
我们报告了一种在准非侵入条件下使用分束方案实现 X 射线自由电子激光(XFEL)的高级光子诊断的方法。在这里,我们使用透射光栅产生多个分支的 X 射线束。两个主要衍射分支之一(+1 阶)用于在色散方案中进行光谱测量,而另一个分支(-1 阶)则专门用于 XFEL 和光学激光脉冲之间的到达时间诊断。透射的 X 射线束(0 阶)被引导到实验站。为了确认这种定时监测方案的有效性,我们测量了-1 阶和 0 阶分支到达时间之间的相关性。观察到的误差在均方根值中只有 7.0fs。我们的结果表明,光束分支方案适用于高级光子诊断,这将进一步增强 XFEL 的实验能力。