McGray C, Copeland C R, Stavis S M, Geist J
Engineering Physics Division, NIST, Gaithersburg, Maryland, U.S.A.
Modern Microsystems, Silver Spring, Maryland, U.S.A.
J Microsc. 2016 Sep;263(3):238-49. doi: 10.1111/jmi.12384. Epub 2016 Mar 11.
The concept of localization precision, which is essential to localization microscopy, is formally extended from optical point sources to microscopic rigid bodies. Measurement functions are presented to calculate the planar pose and motion of microscopic rigid bodies from localization microscopy data. Physical lower bounds on the associated uncertainties - termed centroid precision and orientation precision - are derived analytically in terms of the characteristics of the optical measurement system and validated numerically by Monte Carlo simulations. The practical utility of these expressions is demonstrated experimentally by an analysis of the motion of a microelectromechanical goniometer indicated by a sparse constellation of fluorescent nanoparticles. Centroid precision and orientation precision, as developed here, are useful concepts due to the generality of the expressions and the widespread interest in localization microscopy for super-resolution imaging and particle tracking.
定位精度的概念对定位显微镜至关重要，它从光学点源正式扩展到微观刚体。提出了测量函数，用于根据定位显微镜数据计算微观刚体的平面姿态和运动。根据光学测量系统的特性，通过分析得出了相关不确定性的物理下限——称为质心精度和方向精度，并通过蒙特卡罗模拟进行了数值验证。通过对由稀疏荧光纳米粒子群指示的微机电测角仪的运动分析，实验证明了这些表达式的实际效用。本文所提出的质心精度和方向精度是有用的概念，这是由于表达式的通用性以及在超分辨率成像和粒子跟踪的定位显微镜方面的广泛兴趣。
