Mathai P P, Liddle J A, Stavis S M
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA; Department of Materials Science and Engineering, University of Maryland, College Park, Maryland 20742, USA.
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
Appl Phys Rev. 2016 Mar;3(1). doi: 10.1063/1.4941675. Epub 2016 Mar 10.
The trajectories of nanoscale particles through microscale environments record useful information about both the particles and the environments. Optical microscopes provide efficient access to this information through measurements of light in the far field from nanoparticles. Such measurements necessarily involve trade-offs in tracking capabilities. This article presents a measurement framework, based on information theory, that facilitates a more systematic understanding of such trade-offs to rationally design tracking systems for diverse applications. This framework includes the degrees of freedom of optical microscopes, which determine the limitations of tracking measurements in theory. In the laboratory, tracking systems are assemblies of sources and sensors, optics and stages, and nanoparticle emitters. The combined characteristics of such systems determine the limitations of tracking measurements in practice. This article reviews this tracking hardware with a focus on the essential functions of nanoparticles as optical emitters and microenvironmental probes. Within these theoretical and practical limitations, experimentalists have implemented a variety of tracking systems with different capabilities. This article reviews a selection of apparatuses and techniques for tracking multiple and single particles by tuning illumination and detection, and by using feedback and confinement to improve the measurements. Prior information is also useful in many tracking systems and measurements, which apply across a broad spectrum of science and technology. In the context of the framework and review of apparatuses and techniques, this article reviews a selection of applications, with particle diffusion serving as a prelude to tracking measurements in biological, fluid, and material systems, fabrication and assembly processes, and engineered devices. In so doing, this review identifies trends and gaps in particle tracking that might influence future research.
纳米级粒子在微观环境中的运动轨迹记录了有关粒子和环境的有用信息。光学显微镜通过测量来自纳米粒子远场的光,有效地获取了这些信息。此类测量必然涉及跟踪能力方面的权衡。本文提出了一个基于信息论的测量框架,有助于更系统地理解此类权衡,从而合理设计适用于各种应用的跟踪系统。该框架包括光学显微镜的自由度,其从理论上确定了跟踪测量的局限性。在实验室中,跟踪系统由光源和传感器、光学器件和载物台以及纳米粒子发射器组成。此类系统的综合特性在实际中决定了跟踪测量的局限性。本文回顾了这种跟踪硬件,重点关注纳米粒子作为光发射器和微环境探测器的基本功能。在这些理论和实际限制范围内,实验人员已经实现了各种具有不同能力的跟踪系统。本文回顾了一系列通过调整照明和检测,以及使用反馈和限制来改进测量的用于跟踪多个和单个粒子的仪器和技术。先验信息在许多跟踪系统和测量中也很有用,这些系统和测量广泛应用于科学技术领域。在该框架以及仪器和技术回顾的背景下,本文回顾了一系列应用,以粒子扩散作为生物、流体和材料系统、制造和组装过程以及工程设备中跟踪测量的前奏。通过这样做,本综述确定了可能影响未来研究的粒子跟踪方面的趋势和差距。