Evaluation of DNA damage induced by Auger electrons from Cs.

PURPOSE

To understand the biological effect of external and internal exposure from Cs, DNA damage spectrum induced by directly emitted electrons (γ-rays, internal conversion electrons, Auger electrons) from Cs was compared with that induced by Cs γ-rays.

METHODS

Monte Carlo track simulation method was used to calculate the microscopic energy deposition pattern in liquid water. Simulation was performed for the two simple target systems in microscale. Radiation sources were placed inside for one system and outside for another system. To simulate the energy deposition by directly emitted electrons from Cs placed inside the system, the multiple ejections of electrons after internal conversion were considered. In the target systems, induction process of DNA damage was modeled and simulated for both direct energy deposition and the water radical reaction on the DNA. The yield and spatial distribution of simple and complex DNA damage including strand breaks and base lesions were calculated for irradiation by electrons and γ-rays from Cs.

RESULTS

The simulation showed that the significant difference in DNA damage spectrum was not caused by directly ejected electrons and γ-rays from Cs.

CONCLUSIONS

The result supports the existing perception that the biological effects by internal and external exposure by Cs are equivalent.