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共聚焦显微镜中陡峭边缘和倒凹的测量。

Measurement of steep edges and undercuts in confocal microscopy.

作者信息

Mueller T, Jordan M, Schneider T, Poesch A, Reithmeier E

机构信息

Institute of Measurement and Automatic Control, Nienburger Str. 17, 30167 Hannover, Germany.

Institute of Measurement and Automatic Control, Nienburger Str. 17, 30167 Hannover, Germany.

出版信息

Micron. 2016 May;84:79-95. doi: 10.1016/j.micron.2016.03.001. Epub 2016 Mar 5.

Abstract

Confocal microscopy is widely used to measure the surface topography of specimen with a precision in the micrometer range. The measurement uncertainty and quality of the acquired data of confocal microscopy depends on various effects, such as optical aberrations, vibrations of the measurement setup and variations in the surface reflectivity. In this article, the influence of steep edges and undercuts on measurement results is examined. Steep edges on the specimen's surface lead to a reduced detector signal which influences the measurement accuracy and undercuts cause surface regions, which cannot be captured in a measurement. The article describes a method to overcome the negative effects of steep edges and undercuts by capturing several measurements of the surface with different angles between the surface and the optical axis of the objective. An algorithm is introduced which stitches different angle measurements together without knowledge of the exact position and orientation of the rotation axis. Thus, the measurement uncertainty due to steep edges and undercuts can be avoided without expensive high-precision rotation stages and time consuming adjustment of the measurement setup.

摘要

共聚焦显微镜被广泛用于测量标本的表面形貌,精度可达微米级。共聚焦显微镜采集数据的测量不确定度和质量取决于多种因素,如光学像差、测量装置的振动以及表面反射率的变化。在本文中,研究了陡峭边缘和底切对测量结果的影响。标本表面的陡峭边缘会导致探测器信号减弱,从而影响测量精度,而底切会导致表面区域在测量中无法被捕获。本文描述了一种方法,通过在表面与物镜光轴之间以不同角度采集表面的多个测量值,来克服陡峭边缘和底切的负面影响。引入了一种算法,该算法可以在不知道旋转轴的确切位置和方向的情况下,将不同角度的测量值拼接在一起。因此,无需昂贵的高精度旋转台和耗时的测量装置调整,就可以避免由于陡峭边缘和底切引起的测量不确定度。

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