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光通信波段集成等离子体电路中的纳米级片上全光逻辑奇偶校验器

Nanoscale on-chip all-optical logic parity checker in integrated plasmonic circuits in optical communication range.

作者信息

Wang Feifan, Gong Zibo, Hu Xiaoyong, Yang Xiaoyu, Yang Hong, Gong Qihuang

机构信息

State Key Laboratory for Mesoscopic Physics &Department of Physics, Collaborative Innovation Center of Quantum Matter, Peking University, Beijing 100871, People's Republic of China.

Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan 030006, People's Republic of China.

出版信息

Sci Rep. 2016 Apr 13;6:24433. doi: 10.1038/srep24433.

DOI:10.1038/srep24433
PMID:27073154
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC4829911/
Abstract

The nanoscale chip-integrated all-optical logic parity checker is an essential core component for optical computing systems and ultrahigh-speed ultrawide-band information processing chips. Unfortunately, little experimental progress has been made in development of these devices to date because of material bottleneck limitations and a lack of effective realization mechanisms. Here, we report a simple and efficient strategy for direct realization of nanoscale chip-integrated all-optical logic parity checkers in integrated plasmonic circuits in the optical communication range. The proposed parity checker consists of two-level cascaded exclusive-OR (XOR) logic gates that are realized based on the linear interference of surface plasmon polaritons propagating in the plasmonic waveguides. The parity of the number of logic 1s in the incident four-bit logic signals is determined, and the output signal is given the logic state 0 for even parity (and 1 for odd parity). Compared with previous reports, the overall device feature size is reduced by more than two orders of magnitude, while ultralow energy consumption is maintained. This work raises the possibility of realization of large-scale integrated information processing chips based on integrated plasmonic circuits, and also provides a way to overcome the intrinsic limitations of serious surface plasmon polariton losses for on-chip integration applications.

摘要

纳米级芯片集成全光逻辑奇偶校验器是光计算系统和超高速超宽带信息处理芯片的关键核心组件。不幸的是,由于材料瓶颈限制和缺乏有效的实现机制,迄今为止这些器件的开发进展甚微。在此,我们报告了一种在光通信范围内的集成等离子体电路中直接实现纳米级芯片集成全光逻辑奇偶校验器的简单有效策略。所提出的奇偶校验器由两级级联异或(XOR)逻辑门组成,这些逻辑门基于在等离子体波导中传播的表面等离子体激元的线性干涉来实现。确定入射四位逻辑信号中逻辑1的数量的奇偶性,对于偶校验,输出信号被赋予逻辑状态0(对于奇校验则为1)。与先前的报告相比,整体器件特征尺寸减小了两个多数量级,同时保持了超低能耗。这项工作提高了基于集成等离子体电路实现大规模集成信息处理芯片的可能性,也提供了一种克服片上集成应用中严重的表面等离子体激元损耗固有局限性的方法。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3512/4829911/32672953ecff/srep24433-f3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3512/4829911/bd5a26453d6c/srep24433-f1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3512/4829911/de5b20aa337e/srep24433-f2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3512/4829911/32672953ecff/srep24433-f3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3512/4829911/bd5a26453d6c/srep24433-f1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3512/4829911/de5b20aa337e/srep24433-f2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3512/4829911/32672953ecff/srep24433-f3.jpg

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