Korobchevskaya Kseniya, Peres Chiara, Li Zhibin, Antipov Alexei, Sheppard Colin J R, Diaspro Alberto, Bianchini Paolo
Nanoscopy, Nanophysics, Istituto Italiano di Tecnologia, Via Morego 30, 16163 Genova, Italy.
Advanced Robotics, Istituto Italiano di Tecnologia, Via Morego 30, 16163 Genova, Italy.
Sci Rep. 2016 May 12;6:25816. doi: 10.1038/srep25816.
We propose and demonstrate a novel subtraction microscopy algorithm, exploiting fluorescence emission difference or switching laser mode and their derivatives for image enhancement. The key novelty of the proposed approach lies in the weighted subtraction coefficient, adjusted pixel-by-pixel with respect to the intensity distributions of initial images. This method produces significant resolution enhancement and minimizes image distortions. Our theoretical and experimental studies demonstrate that this approach can be applied to any optical microscopy techniques, including label free and non-linear methods, where common super-resolution techniques cannot be used.
我们提出并演示了一种新颖的减法显微镜算法,该算法利用荧光发射差异或切换激光模式及其导数来增强图像。所提出方法的关键新颖之处在于加权减法系数,它根据初始图像的强度分布逐像素进行调整。该方法显著提高了分辨率,并将图像失真降至最低。我们的理论和实验研究表明,这种方法可应用于任何光学显微镜技术,包括无标记和非线性方法,而在这些方法中,常用的超分辨率技术无法使用。