Kuznetsov Evgeny, Váchová Libuše, Palková Zdena
a Department of Genetics and Microbiology, Faculty of Science , Charles University in Prague , Prague , Czech Republic.
b Institute of Microbiology of the Czech Academy of Sciences, v.v.i. , Prague , Czech Republic.
Cell Cycle. 2016 Jul 17;15(14):1898-907. doi: 10.1080/15384101.2016.1189043. Epub 2016 May 26.
Yeast harbor several proteins with predicted glucanase activity that are potentially involved in cell wall remodeling during different processes, including mitosis. Here, we showed that 2 of these putative glucanases, Sun4p and Dse2p, co-localize to the yeast birth scar, dependently on presence of the third glucanase, Egt2p. The absence of these glucanases results in inefficient mother-daughter cell separation. The Sun4p, Dse2p and Egt2p localize to the daughter side of the bud neck, possibly forming a complex, and are involved in the separation of the virgin daughter from the mother cell during mitosis. The formation of properly assembled birth scars that delimitate cell wall area restricted in the next budding is dependent on the presence of Aim44p and its transcriptional regulator, Swi5p. AIM44 or SWI5 deletion caused the "budding within the birth scar" phenotype, together with altered localization of the birth scar proteins Sun4p and Dse2p, indicating the impairment of birth scar protein complexes.
酵母含有几种具有预测葡聚糖酶活性的蛋白质，这些蛋白质可能在包括有丝分裂在内的不同过程中参与细胞壁重塑。在这里，我们表明，这些假定的葡聚糖酶中的两种，即Sun4p和Dse2p，依赖于第三种葡聚糖酶Egt2p的存在，共同定位于酵母出芽痕。这些葡聚糖酶的缺失导致母细胞与子细胞分离效率低下。Sun4p、Dse2p和Egt2p定位于芽颈的子细胞一侧，可能形成一个复合物，并在有丝分裂过程中参与未成熟子细胞与母细胞的分离。界定下一次出芽时受限细胞壁区域的正确组装出芽痕的形成取决于Aim44p及其转录调节因子Swi5p的存在。AIM44或SWI5的缺失导致“在出芽痕内出芽”的表型，同时出芽痕蛋白Sun4p和Dse2p的定位发生改变，表明出芽痕蛋白复合物受损。
