Rabhi N, Bohacek K, Batani D, Boutoux G, Ducret J-E, Guillaume E, Jakubowska K, Thaury C, Thfoin I
CELIA (Centre Lasers Intenses et Applications), Université Bordeaux, CNRS, CEA, UMR 5107, F-33405 Talence, France.
ELI Beamlines, Institute of Physics ASCR, Prague, Czech Republic.
Rev Sci Instrum. 2016 May;87(5):053306. doi: 10.1063/1.4950860.
This paper presents the response calibration of Imaging Plates (IPs) for electrons in the 40-180 MeV range using laser-accelerated electrons at Laboratoire d'Optique Appliquée (LOA), Palaiseau, France. In the calibration process, the energy spectrum and charge of electron beams are measured by an independent system composed of a magnetic spectrometer and a Lanex scintillator screen used as a calibrated reference detector. It is possible to insert IPs of different types or stacks of IPs in this spectrometer in order to detect dispersed electrons simultaneously. The response values are inferred from the signal on the IPs, due to an appropriate charge calibration of the reference detector. The effect of thin layers of tungsten in front and/or behind IPs is studied in detail. GEANT4 simulations are used in order to analyze our measurements.
