使用扫描电子纳米束衍射对半结晶聚合物进行取向映射
Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction.
作者信息
Panova Ouliana, Chen X Chelsea, Bustillo Karen C, Ophus Colin, Bhatt Mahesh P, Balsara Nitash, Minor Andrew M
机构信息
Department of Materials Science and Engineering, University of California, Berkeley, CA, USA; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
Department of Chemical and Biomolecular Engineering, University of California, Berkeley, CA, USA; Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA.
出版信息
Micron. 2016 Sep;88:30-6. doi: 10.1016/j.micron.2016.05.008. Epub 2016 May 27.
We demonstrate a scanning electron nanobeam diffraction technique that can be used for mapping the size and distribution of nanoscale crystalline regions in a polymer blend. In addition, it can map the relative orientation of crystallites and the degree of crystallinity of the material. The model polymer blend is a 50:50w/w mixture of semicrystalline poly(3-hexylthiophene-2,5-diyl) (P3HT) and amorphous polystyrene (PS). The technique uses a scanning electron beam to raster across the sample and acquires a diffraction image at each probe position. Through image alignment and filtering, the diffraction image dataset enables mapping of the crystalline regions within the scanned area and construction of an orientation map.
我们展示了一种扫描电子纳米束衍射技术，该技术可用于绘制聚合物共混物中纳米级结晶区域的尺寸和分布。此外，它还可以绘制微晶的相对取向和材料的结晶度。模型聚合物共混物是半结晶聚（3-己基噻吩-2,5-二亚基）（P3HT）和无定形聚苯乙烯（PS）按50:50 w/w混合而成的混合物。该技术使用扫描电子束在样品上进行光栅扫描，并在每个探测位置获取衍射图像。通过图像对齐和滤波，衍射图像数据集能够绘制扫描区域内的结晶区域并构建取向图。
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