National Center for Materials Service Safety (NCMS), ‡Institute of Advanced Materials and Technology, and §School of Materials Science and Engineering, University of Science and Technology Beijing , Beijing 100083, People's Republic of China.
ACS Appl Mater Interfaces. 2016 Jul 20;8(28):18608-19. doi: 10.1021/acsami.6b05080. Epub 2016 Jul 8.
Electrochemically formed passive film on titanium in 1.0 M H2SO4 solution and its thickness, composition, chemical state, and local fine structure are examined by Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and X-ray absorption fine structure. AES analysis reveals that the thickness and composition of oxide film are proportional to the reciprocal of current density in potentiodynamic polarization. XPS depth profiles of the chemical states of titanium exhibit the coexistence of various valences cations in the surface. Quantitative X-ray absorption near edge structure analysis of the local electronic structure of the topmost surface (∼5.0 nm) shows that the ratio of [TiO2]/[Ti2O3] is consistent with that of passivation/dissolution of electrochemical activity. Theoretical calculation and analysis of extended X-ray absorption fine structure spectra at Ti K-edge indicate that both the structures of passivation and dissolution are distorted caused by the appearance of two different sites of Ti-O and Ti-Ti. And the bound water in the topmost surface plays a vital role in structural disorder confirmed by XPS. Overall, the increase of average Ti-O coordination causes the electrochemical passivation, and the dissolution is due to the decrease of average Ti-Ti coordination. The structural variations of passivation in coordination number and interatomic distance are in good agreement with the prediction of point defect model.
在 1.0 M H2SO4 溶液中,通过俄歇电子能谱 (AES)、X 射线光电子能谱 (XPS) 和 X 射线吸收精细结构研究了钛的电化学形成的无源膜及其厚度、组成、化学状态和局部精细结构。AES 分析表明,氧化膜的厚度和组成与动电位极化中电流密度的倒数成正比。XPS 化学态钛的深度分布显示表面共存各种价态阳离子。对最表层(约 5.0nm)局部电子结构的定量 X 射线吸收近边结构分析表明,[TiO2]/[Ti2O3] 的比值与电化学活性的钝化/溶解一致。Ti K 边扩展 X 射线吸收精细结构光谱的理论计算和分析表明,钝化和溶解的结构都因 Ti-O 和 Ti-Ti 两个不同位置的出现而发生扭曲。最表层的结合水在结构无序中起重要作用,这一点通过 XPS 得到了证实。总的来说,平均 Ti-O 配位数的增加导致电化学钝化,而溶解则是由于平均 Ti-Ti 配位数的减少。钝化在配位数和原子间距离上的结构变化与点缺陷模型的预测非常吻合。