Sarmiento-Merenguel J Darío, Ortega-Moñux Alejandro, Fédéli Jean-Marc, Wangüemert-Pérez J Gonzalo, Alonso-Ramos Carlos, Durán-Valdeiglesias Elena, Cheben Pavel, Molina-Fernández Íñigo, Halir Robert
Opt Lett. 2016 Aug 1;41(15):3443-6. doi: 10.1364/OL.41.003443.
Subwavelength gratings (SWG) are photonic structures with a period small enough to suppress diffraction, thereby acting as artificial dielectric materials, also called all-dielectric metamaterials. This property has been exploited in many high-performance photonic integrated devices in the silicon-on-insulator (SOI) platform. While SWG waveguides are theoretically lossless, they may exhibit leakage penalty to the substrate due to a combination of reduced modal confinement and finite thickness of the buried oxide (BOX) layer. In this Letter, for the first time, to the best of our knowledge, we analyze substrate leakage losses in SWG waveguides. We establish a direct relation between the effective index of the waveguide mode and the leakage losses which, remarkably, is independent of the geometric parameters of the SWG waveguide. This universal relation is demonstrated both numerically and experimentally, and it provides practical design guidelines to mitigate leakage losses. For BOX thicknesses of 2 and 3 μm, we find negligible leakage losses when the mode effective index is higher than 1.65 and 1.55, respectively.
亚波长光栅(SWG)是一种光子结构,其周期小到足以抑制衍射,从而起到人工介电材料的作用,也被称为全介电超材料。这种特性已在绝缘体上硅(SOI)平台的许多高性能光子集成器件中得到应用。虽然SWG波导理论上是无损的,但由于模式限制降低和掩埋氧化物(BOX)层有限厚度的综合作用,它们可能会对衬底表现出泄漏损耗。在本信函中,据我们所知,我们首次分析了SWG波导中的衬底泄漏损耗。我们建立了波导模式的有效折射率与泄漏损耗之间的直接关系,值得注意的是,该关系与SWG波导的几何参数无关。这种通用关系通过数值和实验得到了验证,它为减轻泄漏损耗提供了实用的设计指导。对于2μm和3μm的BOX厚度,当模式有效折射率分别高于1.65和1.55时,我们发现泄漏损耗可忽略不计。