薄钇稳定氧化锆（YSZ）层中晶粒与晶界阻抗的分离。

The separation of grain and grain boundary impedance in thin yttria stabilized zirconia (YSZ) layers.

作者信息

Gerstl M, Navickas E, Friedbacher G, Kubel F, Ahrens M, Fleig J

机构信息

Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9-164/EC, 1060 Vienna, Austria.

Institute of Chemical Technologies and Analytics, Vienna University of Technology, Getreidemarkt 9-164/EC, 1060 Vienna, Austria; Institute of Materials Science, Kaunas University of Technology, Savanoriu 271, 50131 Kaunas, Lithuania.

出版信息

Solid State Ion. 2011 Mar 11;185(1):32-41. doi: 10.1016/j.ssi.2011.01.008.

DOI:10.1016/j.ssi.2011.01.008

PMID:27570327

原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC4986312/

Abstract

An improved electrode geometry is proposed to study thin ion conducting films by impedance spectroscopy. It is shown that long, thin, and closely spaced electrodes arranged interdigitally allow a separation of grain and grain boundary effects also in very thin films. This separation is shown to be successful for yttria stabilized zirconia (YSZ) layers thinner than 20 nm. In a series of experiments it is demonstrated that the extracted parameters correspond to the YSZ grain boundary and grain bulk resistances or to grain boundary and substrate capacitances. Results also show that our YSZ films produced by pulsed-laser deposition (PLD) on sapphire substrates exhibit a bulk conductivity which is very close to that of macroscopic YSZ samples.

摘要

提出了一种改进的电极几何结构，用于通过阻抗谱研究薄离子导电薄膜。结果表明，以叉指形式排列的长、细且间距紧密的电极，即使在非常薄的薄膜中也能分离晶粒和晶界效应。对于厚度小于20纳米的氧化钇稳定氧化锆（YSZ）层，这种分离被证明是成功的。在一系列实验中表明，提取的参数对应于YSZ晶界和晶粒体电阻，或晶界和衬底电容。结果还表明，我们通过脉冲激光沉积（PLD）在蓝宝石衬底上制备的YSZ薄膜表现出的体电导率与宏观YSZ样品非常接近。