Nobles J E, Zagorodnii V, Hutchison A, Celinski Z
Center for Magnetism and Magnetic Nanostructures, University of Colorado Colorado Springs, 1420 Austin Bluffs Parkway, Colorado Springs, Colorado 80918, USA.
Rev Sci Instrum. 2016 Aug;87(8):084701. doi: 10.1063/1.4959109.
We report the development of a test setup designed to provide a variable frequency biasing signal to a vector network analyzer (VNA). The test setup is currently used for the testing of liquid crystal (LC) based devices in the microwave region. The use of an AC bias for LC based devices minimizes the negative effects associated with ionic impurities in the media encountered with DC biasing. The test setup utilizes bias tees on the VNA test station to inject the bias signal. The square wave biasing signal is variable from 0.5 to 36.0 V peak-to-peak (VPP) with a frequency range of DC to 10 kHz. The test setup protects the VNA from transient processes, voltage spikes, and high-frequency leakage. Additionally, the signals to the VNA are fused to ½ amp and clipped to a maximum of 36 VPP based on bias tee limitations. This setup allows us to measure S-parameters as a function of both the voltage and the frequency of the applied bias signal.
我们报告了一种测试装置的开发情况,该装置旨在为矢量网络分析仪(VNA)提供可变频率的偏置信号。该测试装置目前用于微波区域基于液晶(LC)的器件测试。对基于LC的器件使用交流偏置可将与直流偏置时介质中离子杂质相关的负面影响降至最低。该测试装置利用VNA测试站上的偏置三通来注入偏置信号。方波偏置信号的峰峰值(VPP)在0.5至36.0 V之间可变,频率范围为直流至10 kHz。该测试装置可保护VNA免受瞬态过程、电压尖峰和高频泄漏的影响。此外,根据偏置三通的限制,输入到VNA的信号被熔断至0.5安培,并限幅到最大36 VPP。此装置使我们能够测量作为所施加偏置信号的电压和频率函数的S参数。