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用于相位和响应时间测量的微波干涉仪。

Microwave interferometer for phase and response time measurements.

作者信息

Nobles J E, Hankiewicz J, Bueno Baques D, Celinski Z

机构信息

Center for Magnetism and Magnetic Nanostructures, University of Colorado, Colorado Springs, 1420 Austin Bluffs Parkway, Colorado Springs, Colorado 80918, USA.

出版信息

Rev Sci Instrum. 2020 Feb 1;91(2):024707. doi: 10.1063/1.5138591.

Abstract

We report the development of a microwave interferometer using a quadrature intermediate frequency (IQ) mixer designed to measure the relative phase change and response time of microwave devices tested in the K and upper K bands (22-40 GHz). The interferometer is currently used to test liquid crystal based devices. The system allows for the application of an AC bias beyond the amplitude/frequency limitations imposed on vector network analyzer bias ports. Our IQ mixer based design uses bias signals ranging from 0 to 100 V peak-to-peak in a frequency range from DC to 100 kHz. This range of bias signals is necessary to properly test the response of microwave devices designed with liquid crystal materials. The setup enables us to measure changes in the output phase of the device as a function of both the voltage and frequency of the applied bias signal. The setup also measures the phase difference as a function of microwave frequency and response times for the device under test. Our system can be integrated into a stand-alone test setup without the need for a vector network analyzer.

摘要

我们报告了一种使用正交中频(IQ)混频器的微波干涉仪的开发情况,该干涉仪旨在测量在K波段和K波段以上(22 - 40 GHz)测试的微波器件的相对相位变化和响应时间。该干涉仪目前用于测试基于液晶的器件。该系统允许施加超出矢量网络分析仪偏置端口所施加的幅度/频率限制的交流偏置。我们基于IQ混频器的设计使用的偏置信号峰峰值范围为0至100 V,频率范围为直流至100 kHz。此偏置信号范围对于正确测试采用液晶材料设计的微波器件的响应是必要的。该设置使我们能够测量器件输出相位随所施加偏置信号的电压和频率的变化。该设置还测量作为被测器件的微波频率和响应时间函数的相位差。我们的系统可以集成到一个独立的测试设置中,而无需矢量网络分析仪。

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