Ye Fan, Lee Jaesung, Hu Jin, Mao Zhiqiang, Wei Jiang, Feng Philip X-L
Department of Electrical Engineering & Computer Science, Case School of Engineering, Case Western Reserve University, 10900 Euclid Avenue, Cleveland, OH, 44106, USA.
Department of Physics and Engineering Physics, Tulane University, New Orleans, LA, 70118, USA.
Small. 2016 Nov;12(42):5802-5808. doi: 10.1002/smll.201601207. Epub 2016 Sep 8.
The ambient environmental instability and degradation mechanism of single- and few-layer WTe are investigated. Oxidation of W and Te atoms appears to be a main reason for degradation. Single-layer samples' Raman signals disappear within 20 min in air. Few-layer WTe exhibits saturating degradation behavior: only the top layer WTe is oxidized; the degraded layer can protect inner layers from further degradation.
研究了单层和少层WTe的环境稳定性及降解机制。W和Te原子的氧化似乎是降解的主要原因。单层样品在空气中20分钟内拉曼信号消失。少层WTe表现出饱和降解行为:仅顶层WTe被氧化,降解层可保护内层免于进一步降解。