Wyse Adam E
Adam E. Wyse, The American Registry of Radiologic Technologists, 1255 Northland Dr., St. Paul, MN 55120 USA,
J Appl Meas. 2016;17(3):293-301.
This article discusses sample size and probability threshold considerations in the use of the tailored data method with the Rasch model. In the tailored data method, one performs an initial Rasch analysis and then reanalyzes data after setting item responses to missing that are below a chosen probability threshold. A simple analytical formula is provided that can be used to check whether or not the application of the tailored data method with a chosen probability threshold will create situations in which the number of remaining item responses for the Rasch calibration will or will not meet minimum sample size requirements. The formula is illustrated using a real data example from a medical imaging licensure exam with several different probability thresholds. It is shown that as the probability threshold was increased more item responses were set to missing and the parameter standard errors and item difficulty estimates also tended to increase. It is suggested that some consideration should be given to the chosen probability threshold and how this interacts with potential examinee sample sizes and the accuracy of parameter estimates when calibrating data with the tailored data method.
