Odstrčil T, Pütterich T, Odstrčil M, Gude A, Igochine V, Stroth U
Max Planck Institute for Plasma Physics, Boltzmannstr. 2, 85748 Garching, Germany.
Optoelectronic Research Center, University of Southampton, Southampton, United Kingdom.
Rev Sci Instrum. 2016 Dec;87(12):123505. doi: 10.1063/1.4971367.
The soft X-ray (SXR) emission provides valuable insight into processes happening inside of high-temperature plasmas. A standard method for deriving the local emissivity profiles of the plasma from the line-of-sight integrals measured by pinhole cameras is the tomographic inversion. Such an inversion is challenging due to its ill-conditioned nature and because the reconstructed profiles depend not only on the quality of the measurements but also on the inversion algorithm used. This paper provides a detailed description of several tomography algorithms, which solve the inversion problem of Tikhonov regularization with linear computational complexity in the number of basis functions. The feasibility of combining these methods with the minimum Fisher information regularization is demonstrated, and various statistical methods for the optimal choice of the regularization parameter are investigated with emphasis on their reliability and robustness. Finally, the accuracy and the capability of the methods are demonstrated by reconstructions of experimental SXR profiles, featuring poloidal asymmetric impurity distributions as measured at the ASDEX Upgrade tokamak.
软X射线(SXR)发射为了解高温等离子体内部发生的过程提供了有价值的见解。通过针孔相机测量的视线积分来推导等离子体局部发射率分布的标准方法是断层反演。由于其病态性质以及重建的分布不仅取决于测量质量还取决于所使用的反演算法,这种反演具有挑战性。本文详细描述了几种断层算法,这些算法以基函数数量的线性计算复杂度解决了蒂霍诺夫正则化的反演问题。证明了将这些方法与最小费舍尔信息正则化相结合的可行性,并研究了各种用于正则化参数最优选择的统计方法,重点是它们的可靠性和稳健性。最后,通过对实验SXR分布的重建展示了这些方法的准确性和能力,这些分布具有在ASDEX升级托卡马克上测量的极向不对称杂质分布特征。