Yu Jian, Liu Shenye, Li Jin, Yang Zhiwen, Chen Ming, Guo Luting, Yao Li, Xiao Shali
College of Optoelectronic Engineering, Chongqing University, Chongqing 400044, China.
Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China.
Rev Sci Instrum. 2016 Dec;87(12):123506. doi: 10.1063/1.4971847.
In this paper, we introduce a new method to calibrate the absolute sensitivity of a soft X-ray streak camera (SXRSC). The calibrations are done in the static mode by using a small laser-produced X-ray source. A calibrated X-ray CCD is used as a secondary standard detector to monitor the X-ray source intensity. In addition, two sets of holographic flat-field grating spectrometers are chosen as the spectral discrimination systems of the SXRSC and the X-ray CCD. The absolute sensitivity of the SXRSC is obtained by comparing the signal counts of the SXRSC to the output counts of the X-ray CCD. Results show that the calibrated spectrum covers the range from 200 eV to 1040 eV. The change of the absolute sensitivity in the vicinity of the K-edge of the carbon can also be clearly seen. The experimental values agree with the calculated values to within 29% error. Compared with previous calibration methods, the proposed method has several advantages: a wide spectral range, high accuracy, and simple data processing. Our calibration results can be used to make quantitative X-ray flux measurements in laser fusion research.
在本文中，我们介绍了一种校准软X射线条纹相机（SXRSC）绝对灵敏度的新方法。校准是在静态模式下通过使用小型激光产生的X射线源进行的。一个经过校准的X射线电荷耦合器件（X-ray CCD）用作二级标准探测器来监测X射线源强度。此外，选择两组全息平场光栅光谱仪作为SXRSC和X射线CCD的光谱鉴别系统。通过将SXRSC的信号计数与X射线CCD的输出计数进行比较，获得SXRSC的绝对灵敏度。结果表明，校准后的光谱范围覆盖从200电子伏特到1040电子伏特。在碳的K边附近绝对灵敏度的变化也能清晰可见。实验值与计算值的误差在29%以内。与以前的校准方法相比，所提出的方法具有几个优点：光谱范围宽、精度高以及数据处理简单。我们的校准结果可用于激光聚变研究中的定量X射线通量测量。
