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用于中红外光子学的低损耗富锗硅锗波导

Low-loss Ge-rich SiGe waveguides for mid-infrared photonics.

作者信息

Ramirez Joan Manel, Vakarin Vladyslav, Gilles Clement, Frigerio Jacopo, Ballabio Andrea, Chaisakul Papichaya, Roux Xavier Le, Alonso-Ramos Carlos, Maisons Gregory, Vivien Laurent, Carras Mathieu, Isella Giovanni, Marris-Morini Delphine

出版信息

Opt Lett. 2017 Jan 1;42(1):105-108. doi: 10.1364/OL.42.000105.

Abstract

We demonstrate low-loss Ge-rich SiGe waveguides on SiGe (x from 0 to 0.79) graded substrates operating in the mid-infrared wavelength range at λ=4.6  μm. Propagation losses as low as (1.5±0.5)dB/cm and (2±0.5)dB/cm were measured for the quasi-TE and quasi-TM polarizations, respectively. A total coupling loss (input/output) of only 10 dB was found for waveguide widths larger than 7 μm due to a good fiber-waveguide mode matching. Near-field optical mode profiles measured at the output waveguide facet allowed us to inspect the optical mode and precisely measure the modal effective area of each waveguide providing a good correlation between experiments and simulations. These results put forward the potential of low-index-contrast SiGe waveguides with high Ge concentration as fundamental blocks for mid-infrared photonic integrated circuits.

摘要

我们展示了在SiGe(x从0到0.79)渐变衬底上的低损耗富锗SiGe波导,其在中红外波长范围λ = 4.6μm下工作。对于准TE和准TM偏振,分别测量到低至(1.5±0.5)dB/cm和(2±0.5)dB/cm的传播损耗。由于良好的光纤 - 波导模式匹配,对于宽度大于7μm的波导,发现总的耦合损耗(输入/输出)仅为10dB。在输出波导端面测量的近场光学模式轮廓使我们能够检查光学模式并精确测量每个波导的模式有效面积,从而在实验和模拟之间提供了良好的相关性。这些结果提出了具有高锗浓度的低折射率对比度SiGe波导作为中红外光子集成电路基本模块的潜力。

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