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WO 中的本征缺陷和 H 掺杂。

Intrinsic Defects and H Doping in WO.

机构信息

King Abdullah University of Science and Technology (KAUST), Physical Science and Engineering Division (PSE), Thuwal 23955-6900, Saudi Arabia.

Institute of Nanoscience and Nanotechnology (INN), National Center for Scientific Research Demokritos, 15310 Aghia Paraskevi, Athens, Greece.

出版信息

Sci Rep. 2017 Jan 18;7:40882. doi: 10.1038/srep40882.

Abstract

WO is widely used as industrial catalyst. Intrinsic and/or extrinsic defects can tune the electronic properties and extend applications to gas sensors and optoelectonics. However, H doping is a challenge to WO, the relevant mechanisms being hardly understood. In this context, we investigate intrinsic defects and H doping by density functional theory and experiments. Formation energies are calculated to determine the lowest energy defect states. O vacancies turn out to be stable in O-poor environment, in agreement with X-ray photoelectron spectroscopy, and O-H bond formation of H interstitial defects is predicted and confirmed by Fourier transform infrared spectroscopy.

摘要

WO 被广泛用作工业催化剂。本征和/或外禀缺陷可以调整其电子性质,将其应用扩展到气体传感器和光电子学领域。然而,对于 WO 来说,H 掺杂是一个挑战,其相关机制很难理解。在这种情况下,我们通过密度泛函理论和实验研究了本征缺陷和 H 掺杂。通过形成能的计算来确定最低能量的缺陷态。结果表明,在贫氧环境中,O 空位是稳定的,这与 X 射线光电子能谱的结果一致,并且预测并通过傅里叶变换红外光谱证实了 H 间隙缺陷的 O-H 键形成。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7d5f/5241671/1cecafc45ddd/srep40882-f1.jpg

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