Center for Nanochemistry (CNC), Beijing National Laboratory for Molecular Sciences, College of Chemistry and Molecular Engineering, Academy for Advanced Interdisciplinary Studies, Peking University , Beijing 100871, People's Republic of China.
Key Laboratory of Materials Modification by Laser, Ion and Electron Beams, Dalian University of Technology, Ministry of Education , Dalian 116024, People's Republic of China.
ACS Nano. 2017 Feb 28;11(2):1807-1815. doi: 10.1021/acsnano.6b07773. Epub 2017 Jan 27.
Hetero-epitaxial growth of hexagonal boron nitride (h-BN) from the edges of graphene domains or vice versa has been widely observed during synthesis of in-plane heterostructures of h-BN-G on Rh(111), Ir(111), and even Cu foil. We report that on a strongly coupled Re(0001) substrate via a similar two-step sequential growth strategy, h-BN preferably nucleated on the edges of Re(0001) steps rather than on the edges of existing graphene domains. Statistically, one-third of the domain boundaries of graphene and h-BN were patched seamlessly, and the others were characterized by obvious "defect lines" when the total coverage approached a full monolayer. This imperfect merging behavior can be explained by translational misalignment and lattice mismatch of the resulting separated component domains. According to density functional theory calculations, this coexisting patching and non-patching growth behavior was radically mediated by the strong adlayer-substrate (A-S) interactions, as well as the disparate formation energies of the attachment of B-N pairs or B-N lines along the edges of the Re(0001) steps versus the graphene domains. This work will be of fundamental significance for the controllable synthesis of in-plane heterostructures constructed from two-dimensional layered materials with consideration of A-S interactions.
六方氮化硼(h-BN)在 Rh(111)、Ir(111),甚至 Cu 箔等二维层状材料的面内异质结构合成过程中,从石墨烯畴边缘或反之,均可广泛观察到其异质外延生长。我们报告了在通过类似的两步顺序生长策略的强耦合 Re(0001)衬底上,h-BN 优先在 Re(0001)台阶的边缘而不是在现有石墨烯畴的边缘上成核。统计上,石墨烯和 h-BN 的三分之一畴界无缝连接,而当总覆盖率接近单层时,其他畴界的特征是明显的“缺陷线”。这种不完美的合并行为可以通过分离的组件畴的平移失配和晶格失配来解释。根据密度泛函理论计算,这种共存的修补和非修补生长行为是由强吸附层-衬底(A-S)相互作用以及 B-N 对或 B-N 线沿 Re(0001)台阶边缘与石墨烯畴的附着的不同形成能所彻底介导的。这项工作对于考虑 A-S 相互作用的二维层状材料构建的面内异质结构的可控合成具有重要的基础意义。