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溶液处理的聚(N-乙烯基咔唑)-共价接枝 MoS 纳米片用于非易失性可重写存储器件。

Solution-processable poly(N-vinylcarbazole)-covalently grafted MoS nanosheets for nonvolatile rewritable memory devices.

机构信息

Key Laboratory for Advanced Materials, Institute of Applied Chemistry, East China University of Science and Technology, 130 Meilong Road, Shanghai 200237, China.

出版信息

Nanoscale. 2017 Feb 16;9(7):2449-2456. doi: 10.1039/c6nr09241a.

Abstract

A novel nonvolatile rewritable memory device based on the soluble poly(N-vinylcarbazole)-chemically modified MoS nanosheets (MoS-PVK) was fabricated with the configuration of Au/MoS-PVK/ITO. This is the first example of polymer covalently modified MoS nanosheet-based memory devices. As expected, this device exhibited a typical storage performance of nonvolatile rewritable memory, with a turn-on voltage of -1.54 V and an ON/OFF current ratio of 4 × 10. After annealing at 80 °C for 1 h under a nitrogen atmosphere, a high ON/OFF current ratio (up to 3 × 10) and a lower turn-on voltage (-1.31 V), which are among the best reported for MoS-based polymer/organic memory devices, were achieved due to enhanced crystallization of PVK, which induced a more efficient intramolecular charge transfer effect between PVK and MoS during the annealing process. The effect of film thickness on the current-voltage characteristics of the MoS-PVK-based devices and the memory performance of the MoS/PVK blends-based devices have also been explored.

摘要

一种基于可溶性聚(N-乙烯基咔唑)-化学改性 MoS 纳米片(MoS-PVK)的新型非易失性可重写存储器件采用 Au/MoS-PVK/ITO 的结构制备。这是首例聚合物共价修饰 MoS 纳米片基存储器件的报道。正如预期的那样,该器件表现出典型的非易失性可重写存储性能,开启电压为-1.54 V,ON/OFF 电流比为 4×10。在氮气气氛下 80°C 退火 1 h 后,由于 PVK 的结晶增强,实现了更高的 ON/OFF 电流比(高达 3×10)和更低的开启电压(-1.31 V),这是报道的基于 MoS 的聚合物/有机存储器件中最好的结果之一,这归因于在退火过程中 PVK 和 MoS 之间更有效的分子内电荷转移效应。还探索了 MoS-PVK 基器件的薄膜厚度对电流-电压特性的影响以及 MoS/PVK 共混物基器件的存储性能。

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