Half-flat vs. atomically flat: Alkyl monolayers on morphologically controlled Si(100) and Si(111) have very similar structure, density, and chemical stability.

Chemists have long preferred the Si(111) surface for chemical functionalization, as a simple aqueous etch can be used to produce ideal, atomically flat H/Si(111) surfaces for subsequent reactions. In contrast, industry-standard etches produce rough H/Si(100) surfaces terminated by nanohillocks. The recent discovery of an aqueous etch that produces morphologically controlled H/Si(100) surfaces with a near atomically flat or "half-flat" morphology challenges the assumption that Si(111) is an inherently preferable starting point for chemical functionalization. This study shows that alkyl functionalization of morphologically controlled, "half-flat" Si(100) surfaces by terminal alkenes produces dense, tightly packed monolayers that are essentially identical to those on atomically flat Si(111). The striking similarity between the infrared spectra on these two surfaces - in terms of absolute absorbance, line shape and position, and polarization dependence - strongly suggests that alkyl monolayers on morphologically controlled Si(111) and Si(100) have essentially identical structures. The principle difference between the two surfaces is the amount of residual H at the Si/organic interface, a difference that is dictated by the structure of the Si(100) surface. Alkyl monolayers on morphologically controlled Si(111) and Si(100) surfaces were shown to be equally resistant to harsh oxidants. As a result, there appears to be no chemical reason to prefer one surface over the other, at least for functionalization with terminal alkenes.