Reikowski Finn, Wiegmann Tim, Stettner Jochim, Drnec Jakub, Honkimäki Veijo, Maroun Fouad, Allongue Philippe, Magnussen Olaf M
Institute of Experimental and Applied Physics, Kiel University , 24098 Kiel, Germany.
Experimental Division, ESRF , 71 Avenue des Martyrs, 38000 Grenoble, France.
J Phys Chem Lett. 2017 Mar 2;8(5):1067-1071. doi: 10.1021/acs.jpclett.7b00332. Epub 2017 Feb 17.
Processes at material interfaces to liquids or to high-pressure gases often involve structural changes that are heterogeneous on the micrometer scale. We present a novel in situ X-ray scattering technique that uses high-energy photons and a transmission geometry for atomic-scale studies under these conditions. Transmission surface diffraction gives access to a large fraction of reciprocal space in a single acquisition, allowing direct imaging of the in-plane atomic arrangement at the interface. Experiments with focused X-ray beams enable mapping of these structural properties with micrometer spatial resolution. The potential of this new technique is illustrated by in situ studies of electrochemical surface phase transitions and deposition processes.
材料与液体或高压气体界面处的过程通常涉及微米尺度上的非均匀结构变化。我们提出了一种新颖的原位X射线散射技术，该技术使用高能光子和透射几何结构，用于在这些条件下进行原子尺度的研究。透射表面衍射在单次采集时就能获取很大一部分倒易空间，从而可以直接成像界面处的面内原子排列。使用聚焦X射线束进行的实验能够以微米空间分辨率绘制这些结构特性。通过对电化学表面相变和沉积过程的原位研究，展示了这项新技术的潜力。
