Ryger Ivan, Harber Dave, Stephens Michelle, White Malcolm, Tomlin Nathan, Spidell Matthew, Lehman John
National Institute of Standards and Technology, Boulder, Colorado 80305, USA.
Laboratory for Atmospheric and Space Physics, Boulder, Colorado 80303-7814, USA.
Rev Sci Instrum. 2017 Feb;88(2):024707. doi: 10.1063/1.4976029.
As part of the development of a spectrally uniform room-temperature absolute radiometer, we have studied the electrical noise of several bulk chip thermistors in order to estimate the noise floor and optical dynamic range. Understanding the fundamental limits of the temperature sensitivity leads inevitably to studying the noise background of the complex electro-thermal system. To this end, we employ a measurement technique based on alternating current synchronous demodulation. Results of our analysis show that the combination of a low-current noise Junction Field Effect Transistor (JFET) preamplifier together with chip thermistors is optimal for our purpose, yielding a root mean square noise temperature of 2.8 μK in the frequency range of 0.01 Hz to 1 Hz.
作为光谱均匀室温绝对辐射计研发工作的一部分，我们研究了几种体硅芯片热敏电阻的电噪声，以便估算本底噪声和光学动态范围。要理解温度灵敏度的基本极限，不可避免地要研究复杂电热系统的噪声本底。为此，我们采用了基于交流同步解调的测量技术。我们的分析结果表明，低电流噪声结型场效应晶体管（JFET）前置放大器与芯片热敏电阻相结合，最适合我们的目的，在0.01 Hz至1 Hz的频率范围内产生的均方根噪声温度为2.8 μK。
